NXP Semiconductors /QN908XC /FLASH /ERR_INFOH1

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Interpret as ERR_INFOH1

31 2827 2423 2019 1615 1211 87 43 0 0 0 0 0 0 0 0 00 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0WR_FAILEDH_ADDR0SMART_FAILH_CTR

Description

no description available

Fields

WR_FAILEDH_ADDR

When a flash block 1 smart write fails, the address is stored in this bit field

SMART_FAILH_CTR

The amount of fails during a msart write or smart erase is stored int his bit field

Links

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